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Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

التفاصيل البيبلوغرافية
العنوان: Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy
المؤلفون: Patrick Philipp, Lukasz Rzeznik, Tom Wirtz
المصدر: Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 1749-1760 (2016)
بيانات النشر: Beilstein-Institut, 2016.
سنة النشر: 2016
المجموعة: LCC:Technology
LCC:Chemical technology
LCC:Science
LCC:Physics
مصطلحات موضوعية: atomic mixing, depth profiling, helium ion microscopy, ion bombardment, numerical simulations, polymers, SDTRIMSP, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
الوصف: The analysis of polymers by secondary ion mass spectrometry (SIMS) has been a topic of interest for many years. In recent years, the primary ion species evolved from heavy monatomic ions to cluster and massive cluster primary ions in order to preserve a maximum of organic information. The progress in less-damaging sputtering goes along with a loss in lateral resolution for 2D and 3D imaging. By contrast the development of a mass spectrometer as an add-on tool for the helium ion microscope (HIM), which uses finely focussed He+ or Ne+ beams, allows for the analysis of secondary ions and small secondary cluster ions with unprecedented lateral resolution. Irradiation induced damage and depth profiling capabilities obtained with these light rare gas species have been far less investigated than ion species used classically in SIMS. In this paper we simulated the sputtering of multi-layered polymer samples using the BCA (binary collision approximation) code SD_TRIM_SP to study preferential sputtering and atomic mixing in such samples up to a fluence of 1018 ions/cm2. Results show that helium primary ions are completely inappropriate for depth profiling applications with this kind of sample materials while results for neon are similar to argon. The latter is commonly used as primary ion species in SIMS. For the two heavier species, layers separated by 10 nm can be distinguished for impact energies of a few keV. These results are encouraging for 3D imaging applications where lateral and depth information are of importance.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2190-4286
Relation: https://doaj.org/toc/2190-4286
DOI: 10.3762/bjnano.7.168
URL الوصول: https://doaj.org/article/075a8546536f42f4b3a62cab50aad0ea
رقم الأكسشن: edsdoj.075a8546536f42f4b3a62cab50aad0ea
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:21904286
DOI:10.3762/bjnano.7.168