دورية أكاديمية
Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials
العنوان: | Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials |
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المؤلفون: | Kenji Suzuki, Ayumi Shiro, Hidenori Toyokawa, Choji Saji, Takahisa Shobu |
المصدر: | Quantum Beam Science, Vol 4, Iss 3, p 25 (2020) |
بيانات النشر: | MDPI AG, 2020. |
سنة النشر: | 2020 |
المجموعة: | LCC:Technology LCC:Electrical engineering. Electronics. Nuclear engineering |
مصطلحات موضوعية: | synchrotron white X-ray, double-exposure method, CdTe pixel detector, coarse grain, X-ray stress measurement, austenitic stainless steel, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971 |
الوصف: | Stress measurements of coarse-grained material are difficult using synchrotron X-ray diffraction because the diffraction patterns of coarse-grained materials are spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. Here, a double-exposure method is proposed as the countermeasure against this issue. In the experiment, we introduce a CdTe pixel detector. The detector is a newly developed area detector and can resolve high-energy X-rays. The strains of the coarse-grained material can be measured using a combination of the double-exposure method, white synchrotron X-ray, and the CdTe pixel detector. The bending stress in an austenitic stainless steel plate was measured using the proposed technique. As a result, the measured stress corresponded to the applied bending stress. |
نوع الوثيقة: | article |
وصف الملف: | electronic resource |
اللغة: | English |
تدمد: | 2412-382X |
Relation: | https://www.mdpi.com/2412-382X/4/3/25; https://doaj.org/toc/2412-382X |
DOI: | 10.3390/qubs4030025 |
URL الوصول: | https://doaj.org/article/e1672320d4724bc7a6a3d19ede8f1564 |
رقم الأكسشن: | edsdoj.1672320d4724bc7a6a3d19ede8f1564 |
قاعدة البيانات: | Directory of Open Access Journals |
تدمد: | 2412382X |
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DOI: | 10.3390/qubs4030025 |