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Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials

التفاصيل البيبلوغرافية
العنوان: Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials
المؤلفون: Kenji Suzuki, Ayumi Shiro, Hidenori Toyokawa, Choji Saji, Takahisa Shobu
المصدر: Quantum Beam Science, Vol 4, Iss 3, p 25 (2020)
بيانات النشر: MDPI AG, 2020.
سنة النشر: 2020
المجموعة: LCC:Technology
LCC:Electrical engineering. Electronics. Nuclear engineering
مصطلحات موضوعية: synchrotron white X-ray, double-exposure method, CdTe pixel detector, coarse grain, X-ray stress measurement, austenitic stainless steel, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
الوصف: Stress measurements of coarse-grained material are difficult using synchrotron X-ray diffraction because the diffraction patterns of coarse-grained materials are spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. Here, a double-exposure method is proposed as the countermeasure against this issue. In the experiment, we introduce a CdTe pixel detector. The detector is a newly developed area detector and can resolve high-energy X-rays. The strains of the coarse-grained material can be measured using a combination of the double-exposure method, white synchrotron X-ray, and the CdTe pixel detector. The bending stress in an austenitic stainless steel plate was measured using the proposed technique. As a result, the measured stress corresponded to the applied bending stress.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2412-382X
Relation: https://www.mdpi.com/2412-382X/4/3/25; https://doaj.org/toc/2412-382X
DOI: 10.3390/qubs4030025
URL الوصول: https://doaj.org/article/e1672320d4724bc7a6a3d19ede8f1564
رقم الأكسشن: edsdoj.1672320d4724bc7a6a3d19ede8f1564
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:2412382X
DOI:10.3390/qubs4030025