دورية أكاديمية

A Parity-Based Dual Modular Redundancy Approach for the Reliability of Data Transmission in Nanosatellite’s Onboard Processing

التفاصيل البيبلوغرافية
العنوان: A Parity-Based Dual Modular Redundancy Approach for the Reliability of Data Transmission in Nanosatellite’s Onboard Processing
المؤلفون: Alex C. R. Alves, Luiz F. Q. Silveira, Marcio E. Kreutz, Samaherni M. Dias
المصدر: IEEE Access, Vol 12, Pp 90815-90828 (2024)
بيانات النشر: IEEE, 2024.
سنة النشر: 2024
المجموعة: LCC:Electrical engineering. Electronics. Nuclear engineering
مصطلحات موضوعية: Nanosatellite, data transmission, fault tolerance, FPGA, DMR, parity, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
الوصف: Nanosatellites’ embedded systems must adapt to power, weight, size, and cost constraints. Thus, over the years, the use of Commercial-Off-The-Shelf (COTS) System-on-Chip (SoC) has become common. They have a lower development cost and better performance when compared to components specifically designed for space, although they are more susceptible to the radiation effects. A point of attention in these devices is the reliability of data transmitted between hardcore processors and applications in the reconfigurable logic area. This work proposes a Parity-based Dual Modular Redundancy (PDMR) approach for use in interconnect interfaces of COTS SoCs. The experiments were conducted through simulations with Python scripts and hardware implementations in a Xilinx Zynq-7000 SoC. The proposed technique was compared with the Triple Modular Redundancy (TMR) technique. The simulation results show that for specific rates, the proposed approach reaches values close to those of the TMR and implies a smaller number of bits transmitted even when data detected as erroneous are retransmitted. Meanwhile, hardware implementation results demonstrate a decrease in hardware resource utilization and power consumption compared to TMR implementation.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2169-3536
Relation: https://ieeexplore.ieee.org/document/10579818/; https://doaj.org/toc/2169-3536
DOI: 10.1109/ACCESS.2024.3421608
URL الوصول: https://doaj.org/article/290b9cdd521646b0839c60c530270991
رقم الأكسشن: edsdoj.290b9cdd521646b0839c60c530270991
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:21693536
DOI:10.1109/ACCESS.2024.3421608