دورية أكاديمية

Single-Particle Tracking with Scanning Non-Linear Microscopy

التفاصيل البيبلوغرافية
العنوان: Single-Particle Tracking with Scanning Non-Linear Microscopy
المؤلفون: Théo Travers, Vincent G. Colin, Matthieu Loumaigne, Régis Barillé, Denis Gindre
المصدر: Nanomaterials, Vol 10, Iss 8, p 1519 (2020)
بيانات النشر: MDPI AG, 2020.
سنة النشر: 2020
المجموعة: LCC:Chemistry
مصطلحات موضوعية: non-linear microscopy, two-photon fluorescence imaging, scanning microscopy, single particle tracking, free diffusion, particle size characterization, Chemistry, QD1-999
الوصف: This study describes the adaptation of non-linear microscopy for single-particle tracking (SPT), a method commonly used in biology with single-photon fluorescence. Imaging moving objects with non-linear microscopy raises difficulties due to the scanning process of the acquisitions. The interest of the study is based on the balance between all the experimental parameters (objective, resolution, frame rate) which need to be optimized to record long trajectories with the best accuracy and frame rate. To evaluate the performance of the setup for SPT, several basic estimation methods are used and adapted to the new detection process. The covariance-based estimator (CVE) seems to be the best way to evaluate the diffusion coefficient from trajectories using the specific factors of motion blur and localization error.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2079-4991
Relation: https://www.mdpi.com/2079-4991/10/8/1519; https://doaj.org/toc/2079-4991
DOI: 10.3390/nano10081519
URL الوصول: https://doaj.org/article/43791133350e46fc9b23cdb607f4dfab
رقم الأكسشن: edsdoj.43791133350e46fc9b23cdb607f4dfab
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:20794991
DOI:10.3390/nano10081519