دورية أكاديمية

Interface-induced transverse resistivity anomaly in AgNbO3/SrRuO3 heterostructures

التفاصيل البيبلوغرافية
العنوان: Interface-induced transverse resistivity anomaly in AgNbO3/SrRuO3 heterostructures
المؤلفون: Ruxin Liu, Ruijie Xu, Yequan Chen, Liqi Zhou, Wenzhuo Zhuang, Xu Zhang, Chong Zhang, Zhongqiang Chen, Liming Chen, Xuefeng Wang
المصدر: APL Materials, Vol 12, Iss 2, Pp 021122-021122-6 (2024)
بيانات النشر: AIP Publishing LLC, 2024.
سنة النشر: 2024
المجموعة: LCC:Biotechnology
LCC:Physics
مصطلحات موضوعية: Biotechnology, TP248.13-248.65, Physics, QC1-999
الوصف: The transverse resistivity anomaly with a hump feature, associated with topological magnetic textures, is of paramount importance for the applications of next-generation chiral spintronic devices. However, the origin of the hump feature still remains debated due to the complicated mechanism, not merely assigned to the intrinsic topological Hall effect (THE). In this work, we observe the apparent transverse resistivity hump characteristic superimposed on the Hall signals in AgNbO3/SrRuO3 (ANO/SRO) heterostructures. The intrinsic THE is ruled out by minor-loop and current density measurements. Combining the microscopic characterization and the two-channel anomalous Hall effect fitting, the hump feature is unambiguously attributed to the synergetic contribution from the SRO layer and the interfacial intermixing thin layer of ANO and SRO.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2166-532X
Relation: https://doaj.org/toc/2166-532X
DOI: 10.1063/5.0192702
URL الوصول: https://doaj.org/article/516995ddff9842cc9c31bbfeff9f072e
رقم الأكسشن: edsdoj.516995ddff9842cc9c31bbfeff9f072e
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:2166532X
DOI:10.1063/5.0192702