التفاصيل البيبلوغرافية
العنوان:
Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction
المؤلفون:
Felisa Berenguer , Giorgio Pettinari , Marco Felici , Nilanthy Balakrishnan , Jesse N. Clark , Sylvain Ravy , Amalia Patané , Antonio Polimeni , Gianluca Ciatto
المصدر:
Communications Materials, Vol 1, Iss 1, Pp 1-8 (2020)
بيانات النشر:
Nature Portfolio, 2020.
سنة النشر:
2020
المجموعة:
LCC:Materials of engineering and construction. Mechanics of materials
مصطلحات موضوعية:
Materials of engineering and construction. Mechanics of materials , TA401-492
الوصف:
Coherent x-ray diffractive imaging is a powerful technique for determining strain on the nanometer scale. Here, it is used to image semiconducting GaAs1-yNy structures on a GaAs substrate and to measure strain, demonstrating its potential for studying highly strained interfaces in devices.
نوع الوثيقة:
article
وصف الملف:
electronic resource
اللغة:
English
تدمد:
2662-4443
Relation:
https://doaj.org/toc/2662-4443
DOI:
10.1038/s43246-020-0021-6
URL الوصول:
https://doaj.org/article/c552cf1d1c2e495d85ef0e75514ebf38
رقم الأكسشن:
edsdoj.552cf1d1c2e495d85ef0e75514ebf38
قاعدة البيانات:
Directory of Open Access Journals