Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction

التفاصيل البيبلوغرافية
العنوان:	Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction
المؤلفون:	Felisa Berenguer, Giorgio Pettinari, Marco Felici, Nilanthy Balakrishnan, Jesse N. Clark, Sylvain Ravy, Amalia Patané, Antonio Polimeni, Gianluca Ciatto
المصدر:	Communications Materials, Vol 1, Iss 1, Pp 1-8 (2020)
بيانات النشر:	Nature Portfolio, 2020.
سنة النشر:	2020
المجموعة:	LCC:Materials of engineering and construction. Mechanics of materials
مصطلحات موضوعية:	Materials of engineering and construction. Mechanics of materials, TA401-492
الوصف:	Coherent x-ray diffractive imaging is a powerful technique for determining strain on the nanometer scale. Here, it is used to image semiconducting GaAs1-yNy structures on a GaAs substrate and to measure strain, demonstrating its potential for studying highly strained interfaces in devices.
نوع الوثيقة:	article
وصف الملف:	electronic resource
اللغة:	English
تدمد:	2662-4443
Relation:	https://doaj.org/toc/2662-4443
DOI:	10.1038/s43246-020-0021-6
URL الوصول:	https://doaj.org/article/c552cf1d1c2e495d85ef0e75514ebf38
رقم الأكسشن:	edsdoj.552cf1d1c2e495d85ef0e75514ebf38
قاعدة البيانات:	Directory of Open Access Journals

الوصف
تدمد:	26624443
DOI:	10.1038/s43246-020-0021-6