دورية أكاديمية

Reliability assessment of bidirectional power converters in battery energy storage systems of the DC microgrid

التفاصيل البيبلوغرافية
العنوان: Reliability assessment of bidirectional power converters in battery energy storage systems of the DC microgrid
المؤلفون: Wei-Chang Yeh, Duong Minh Bui, Hung Tan Nguyen, Phuc Duy Le, Tien Minh Cao, Tran Cong Pham
المصدر: Energy Reports, Vol 8, Iss , Pp 845-861 (2022)
بيانات النشر: Elsevier, 2022.
سنة النشر: 2022
المجموعة: LCC:Electrical engineering. Electronics. Nuclear engineering
مصطلحات موضوعية: Bidirectional converter, Battery energy storage system, DC microgrid, Dynamic operation, Transient operation, Reliability, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
الوصف: The bidirectional power-converter (BPC) reliability of battery energy storage systems (BATT-ESSs) in a local off-grid energy community (LOEC) is susceptible to dynamic and fault scenarios. As a great advantage of the BPC, it is widely used for balancing the power between all generating sources and all required loads in the DC microgrid (MG). However, a possible reduction in the BPC reliability of the BATT-ESS is inevitable due to different charging/discharging levels of this BATT-ESS in the DC MG. To make this assumption clear, the novel reliability analysis of the BPCs in BATT-ESSs is proposed in this paper by taking into account their dynamic and transient scenarios in the DC microgrid. The dynamic-voltage-based failure rate (DVBFR) and the fault-current-based failure rate (FCBFR) respectively from dynamic and fault scenarios of the BPC are two main objectives of the reliability study. These two failure rates are combined with the useful-time-based failure rate (UTBFR) and a Markov-based reliability model to give more holistic reliability evaluation results. Experimental results show that the FCBFR of the BPC in the BATT-ESS is larger than its DVBFR. The reliability of the BPC at the system level could be considerably decreased by multiple repeated dynamic cases. For component-level reliability of the BPC, the DVBFR of diodes is also the least impacted by the dynamic cases. Exponential and logarithmic functions are used to describe approximately the rapidly-increasing trendlines of FCBFRs of power-electronic elements in the BPC under the faulted operation cases. Moreover, reliability indices such as mean-time-to-failure (MTTF), mean-time-between-failures (MTBF), and the reliability index (R) of the BPCs in the BATT-ESSs are also quickly decreased by their fault and dynamic cases.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2352-4847
Relation: http://www.sciencedirect.com/science/article/pii/S235248472300121X; https://doaj.org/toc/2352-4847
DOI: 10.1016/j.egyr.2023.01.113
URL الوصول: https://doaj.org/article/5c70e5e6914d42b688f8434f30241895
رقم الأكسشن: edsdoj.5c70e5e6914d42b688f8434f30241895
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:23524847
DOI:10.1016/j.egyr.2023.01.113