دورية أكاديمية
3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy
| العنوان: | 3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy |
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| المؤلفون: | Khaled Kaja, Ammar Assoum, Peter De Wolf, François Piquemal, Antonio Nehmee, Adnan Naja, Taha Beyrouthy, Mustapha Jouiad |
| المصدر: | Advanced Materials Interfaces, Vol 11, Iss 2, Pp n/a-n/a (2024) |
| بيانات النشر: | Wiley-VCH, 2024. |
| سنة النشر: | 2024 |
| المجموعة: | LCC:Physics LCC:Technology |
| مصطلحات موضوعية: | AFM, data clustering, dielectric constant, KPFM, nano tomography, peak force tapping, Physics, QC1-999, Technology |
| الوصف: | Abstract Noninvasive and depth‐sensitive measurements of dielectric properties are becoming of great interest in advanced and complex nanostructured architectures. Here, a straightforward parallel approach applicable in peak force Kelvin probe force microscopy for a 3D measurement of dielectric constants at the nanoscale is demonstrated. The proposed approach features a simultaneous measurement of the mechanical, electrical, and depth‐dependent dielectric properties applied to embedded nanostructures. The findings provide initial elements for further development of experimental dielectric nano‐tomography methods for characterizing buried and embedded systems and dielectric interfaces. |
| نوع الوثيقة: | article |
| وصف الملف: | electronic resource |
| اللغة: | English |
| تدمد: | 2196-7350 |
| Relation: | https://doaj.org/toc/2196-7350 |
| DOI: | 10.1002/admi.202300503 |
| URL الوصول: | https://doaj.org/article/e6a583beb9e14f76a183087b54744b54 |
| رقم الأكسشن: | edsdoj.6a583beb9e14f76a183087b54744b54 |
| قاعدة البيانات: | Directory of Open Access Journals |
Full Text Finder | تدمد: | 21967350 |
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| DOI: | 10.1002/admi.202300503 |