دورية أكاديمية

Defect Detection on Inclined Textured Planes Using the Shape from Texture Method and the Delaunay Triangulation

التفاصيل البيبلوغرافية
العنوان: Defect Detection on Inclined Textured Planes Using the Shape from Texture Method and the Delaunay Triangulation
المؤلفون: Boutté Laurent, Lelandais Sylvie, Plantier Justin
المصدر: EURASIP Journal on Advances in Signal Processing, Vol 2002, Iss 7, p 691045 (2002)
بيانات النشر: SpringerOpen, 2002.
سنة النشر: 2002
المجموعة: LCC:Telecommunication
LCC:Electronics
مصطلحات موضوعية: defect detection, inclined textured planes, wavelet decomposition, local scales, texels extraction, shape from texture method, Delaunay triangulation, Telecommunication, TK5101-6720, Electronics, TK7800-8360
الوصف: We present one method for detecting defects on an inclined textured plane. This method uses a combination of a shape from texture (SFT) method with the Delaunay triangulation technique. The SFT method provides the theoretical equation of the plane orientation in two steps. First, a wavelet decomposition allows us to build an image of the inverse of the local frequency, that is the scale, that we call the local scales map. Then we perform an interpolation of this map using the equation of the theoretical variation of the scales. With the interpolation parameters it is possible to extract the texels by the use of an adaptive thresholding for each pixel of this map. Then we compute the centers of each texel in order to match a mesh on it after processing a Delaunay triangulation. When there is a defect, the regularity of the triangulation is disturbed, so one hole appears in the mesh.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 1687-6172
1687-6180
Relation: https://doaj.org/toc/1687-6172; https://doaj.org/toc/1687-6180
DOI: 10.1155/S1110865702204096
URL الوصول: https://doaj.org/article/83123c12792a4bcdb97dfbbd3ed8132a
رقم الأكسشن: edsdoj.83123c12792a4bcdb97dfbbd3ed8132a
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:16876172
16876180
DOI:10.1155/S1110865702204096