Electronic evidence of temperature-induced Lifshitz transition and topological nature in ZrTe5

التفاصيل البيبلوغرافية
العنوان:	Electronic evidence of temperature-induced Lifshitz transition and topological nature in ZrTe5
المؤلفون:	Yan Zhang, Chenlu Wang, Li Yu, Guodong Liu, Aiji Liang, Jianwei Huang, Simin Nie, Xuan Sun, Yuxiao Zhang, Bing Shen, Jing Liu, Hongming Weng, Lingxiao Zhao, Genfu Chen, Xiaowen Jia, Cheng Hu, Ying Ding, Wenjuan Zhao, Qiang Gao, Cong Li, Shaolong He, Lin Zhao, Fengfeng Zhang, Shenjin Zhang, Feng Yang, Zhimin Wang, Qinjun Peng, Xi Dai, Zhong Fang, Zuyan Xu, Chuangtian Chen, X. J. Zhou
المصدر:	Nature Communications, Vol 8, Iss 1, Pp 1-9 (2017)
بيانات النشر:	Nature Portfolio, 2017.
سنة النشر:	2017
المجموعة:	LCC:Science
مصطلحات موضوعية:	Science
الوصف:	To understand the anomalous electronic transport properties of ZrTe5 remains an elusive puzzle. Here, Zhang et al. report direct electronic evidence to the origin of the resistivity anomaly and temperature induced Lifshitz transition in ZrTe5, indicating it being a weak topological insulator.
نوع الوثيقة:	article
وصف الملف:	electronic resource
اللغة:	English
تدمد:	2041-1723
Relation:	https://doaj.org/toc/2041-1723
DOI:	10.1038/ncomms15512
URL الوصول:	https://doaj.org/article/8a410e96b5eb4481a82665215a30d6a1
رقم الأكسشن:	edsdoj.8a410e96b5eb4481a82665215a30d6a1
قاعدة البيانات:	Directory of Open Access Journals

الوصف
تدمد:	20411723
DOI:	10.1038/ncomms15512