دورية أكاديمية
High-Resolution Detection of Microwave Fields on Chip Surfaces Based on Scanning Microwave Microscopy
| العنوان: | High-Resolution Detection of Microwave Fields on Chip Surfaces Based on Scanning Microwave Microscopy |
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| المؤلفون: | Pei, T., Cheng, F., Jia, X.D., Li, Z.H., Guo, H., Wen, H.F., Li, Y.J., Tang, J., Liu, J. |
| المصدر: | IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-6 2023 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189456 15579662 |
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| DOI: | 10.1109/TIM.2023.3244254 |