دورية أكاديمية

Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies

التفاصيل البيبلوغرافية
العنوان: Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies
المؤلفون: Bosman, D., Huynen, M., De Zutter, D., Sun, X., Pantano, N., Van der Plas, G., Beyne, E., Vande Ginste, D.
المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 71(7):2794-2806 Jul, 2023
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
تدمد:00189480
15579670
DOI:10.1109/TMTT.2023.3244205