دورية أكاديمية
NDE-Based Failure Analysis of an LTCC-Eddy Current Sensor Exposed to High Temperature Using 3-D X-Ray μ-CT
| العنوان: | NDE-Based Failure Analysis of an LTCC-Eddy Current Sensor Exposed to High Temperature Using 3-D X-Ray μ-CT |
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| المؤلفون: | Dutta, C., Kumar, J., Hawaldar, R., Sagar, S.P., Das, T.K. |
| المصدر: | IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(8):8451-8458 Apr, 2023 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 1530437X 15581748 23799153 |
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| DOI: | 10.1109/JSEN.2023.3251559 |