دورية أكاديمية
Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors
| العنوان: | Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors |
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| المؤلفون: | Lee, S., Ronchi, N., Bizindavyi, J., Popovici, M.I., Banerjee, K., Walke, A., Delhougne, R., Van Houdt, J., Shin, C. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(5):2568-2574 May, 2023 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2023.3254509 |