Thermal study of GaN-based HFET devices

التفاصيل البيبلوغرافية
العنوان: Thermal study of GaN-based HFET devices
المؤلفون: Jeong Park, Selah Choe Park, Moo Whan Shin, Lee, C.C.
المصدر: 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345) Electronic components and technology conference Electronic Components and Technology Conference, 2002. Proceedings. 52nd. :617-621 2002
Relation: Proceedings of 52nd Electronic Components and Technology Conference
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780374304
9780780374300
تدمد:05695503
DOI:10.1109/ECTC.2002.1008159