مؤتمر
A physics-based numerical modeling of total ionizing dose effects in CMOS integrated circuits
| العنوان: | A physics-based numerical modeling of total ionizing dose effects in CMOS integrated circuits |
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| المؤلفون: | Cassani, M.V., Salomone, L. Sambuco, Carbonetto, S., Redin, E., Faigon, A., Garcia-Inza, M. |
| المصدر: | 2023 Argentine Conference on Electronics (CAE) Electronics (CAE), 2023 Argentine Conference on. :41-45 Mar, 2023 |
| Relation: | 2023 Argentine Conference on Electronics (CAE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350399547 |
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| DOI: | 10.1109/CAE56623.2023.10086970 |