A Study on the Thermal Budget of Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Capacitors for Next-Generation Memory Applications

التفاصيل البيبلوغرافية
العنوان: A Study on the Thermal Budget of Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Capacitors for Next-Generation Memory Applications
المؤلفون: Park, Hye Ryeon, Yoo, Jeong Gyu, Kang, Jong Mook, Cho, Min Kwan, Gong, Taeho, Park, Seongbin, Lee, Seungbin, Kim, Jin-HYun, Lee, Seojun, Choi, Rino, Kim, Harrison Sejoon, Jung, Yong Chan, Kim, Jiyoung, Kim, Si Joon
المصدر: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2023 7th IEEE. :1-3 Mar, 2023
Relation: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350332520
DOI:10.1109/EDTM55494.2023.10103015