مؤتمر
Innovations in test automation
| العنوان: | Innovations in test automation |
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| المؤلفون: | Sproch, J., Howells, M., Rajski, J. |
| المصدر: | Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) VLSI test symposium VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE. :43-43 2002 |
| Relation: | Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769515703 9780769515700 |
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| DOI: | 10.1109/VTS.2002.1011109 |