التفاصيل البيبلوغرافية
العنوان: |
Investigation on NBTI Control Techniques of HKMG Transistors for Low-power DRAM applications |
المؤلفون: |
Sung, Won Ju, Kim, Hyun Seung, Han, Jung Hoon, Park, Se Guen, Oh, Jeong-Hoon, Ban, Hyodong, Lee, Jooyoung |
المصدر: |
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023 |
Relation: |
2023 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |