Investigation on NBTI Control Techniques of HKMG Transistors for Low-power DRAM applications

التفاصيل البيبلوغرافية
العنوان:	Investigation on NBTI Control Techniques of HKMG Transistors for Low-power DRAM applications
المؤلفون:	Sung, Won Ju, Kim, Hyun Seung, Han, Jung Hoon, Park, Se Guen, Oh, Jeong-Hoon, Ban, Hyodong, Lee, Jooyoung
المصدر:	2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023
Relation:	2023 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات:	IEEE Xplore Digital Library