مؤتمر
The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper)
| العنوان: | The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper) |
|---|---|
| المؤلفون: | Sangani, D., Diaz-Fortuny, J., Bury, E., Kaczer, B., Gielen, G. |
| المصدر: | 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023 |
| Relation: | 2023 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665456722 |
|---|---|
| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS48203.2023.10118026 |