مؤتمر
Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET
| العنوان: | Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET |
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| المؤلفون: | Zhao, Ri-an, Koskinen, Matthew, Liu, Yang, Wan, Xinggong |
| المصدر: | 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023 |
| Relation: | 2023 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665456722 |
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| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS48203.2023.10118309 |