التفاصيل البيبلوغرافية
العنوان: |
Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase Change Memory Arrays |
المؤلفون: |
Meli, V., Navarro, G., Rottner, J., Castellani, N., Martin, S., Tran, N. P., Bourgeois, G., Sabbione, C., Cyrille, M. C. |
المصدر: |
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023 |
Relation: |
2023 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |