Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase Change Memory Arrays

التفاصيل البيبلوغرافية
العنوان: Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase Change Memory Arrays
المؤلفون: Meli, V., Navarro, G., Rottner, J., Castellani, N., Martin, S., Tran, N. P., Bourgeois, G., Sabbione, C., Cyrille, M. C.
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023
Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات: IEEE Xplore Digital Library