Thermal Impact of Solder Voids under Chip of Power Semiconductors

التفاصيل البيبلوغرافية
العنوان: Thermal Impact of Solder Voids under Chip of Power Semiconductors
المؤلفون: Tabakoya, T., Arai, M., Inoue, D., Murakami, K., Matsuo, K., Tsujimura, T.
المصدر: 2023 International Conference on Electronics Packaging (ICEP) Electronics Packaging (ICEP), 2023 International Conference on. :99-100 Apr, 2023
Relation: 2023 International Conference on Electronics Packaging (ICEP)
قاعدة البيانات: IEEE Xplore Digital Library