مؤتمر
A DoD Testing Profile: MBSE for Test and Evaluation Strategy
| العنوان: | A DoD Testing Profile: MBSE for Test and Evaluation Strategy |
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| المؤلفون: | Colombi, John M., Odom, Travis W., Connell, Warren J |
| المصدر: | 2023 IEEE International Systems Conference (SysCon) Systems Conference (SysCon), 2023 IEEE International. :1-8 Apr, 2023 |
| Relation: | 2023 IEEE International Systems Conference (SysCon) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665439947 |
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| تدمد: | 24729647 |
| DOI: | 10.1109/SysCon53073.2023.10131109 |