مؤتمر
Frequency Response Characterization of High-Bandwidth Current Viewing Resistors Used in Dynamic Testing of Power Semiconductors
| العنوان: | Frequency Response Characterization of High-Bandwidth Current Viewing Resistors Used in Dynamic Testing of Power Semiconductors |
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| المؤلفون: | Jimenez, Sergio J., Nelson, Blake W., Curbow, Austin, Lemmon, Andrew N., New, Christopher D. |
| المصدر: | 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2023 IEEE. :69-74 Mar, 2023 |
| Relation: | 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665475396 9781665475389 |
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| تدمد: | 24706647 |
| DOI: | 10.1109/APEC43580.2023.10131165 |