مؤتمر
Bitstream- Level Interconnect Fault Characterization for SRAM-based FPGAs
| العنوان: | Bitstream- Level Interconnect Fault Characterization for SRAM-based FPGAs |
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| المؤلفون: | Fibich, Christian, Horauer, Martin, Obermaisser, Roman |
| المصدر: | 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-2 Apr, 2023 |
| Relation: | 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15581101 |
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| DOI: | 10.23919/DATE56975.2023.10136911 |