التفاصيل البيبلوغرافية
| العنوان: |
Characterization of Interconnect Fault Effects in SRAM-based FPGAs |
| المؤلفون: |
Fibich, Christian, Horauer, Martin, Obermaisser, Roman |
| المصدر: |
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2023 26th International Symposium on. :65-68 May, 2023 |
| Relation: |
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
Full Text Finder