مؤتمر
Outlier Detection for Analog Tests Using Deep Learning Techniques
| العنوان: | Outlier Detection for Analog Tests Using Deep Learning Techniques |
|---|---|
| المؤلفون: | Lin, Chin-Kuan, Lu, Cheng-Che, Chang, Shuo-Wen, Chu, Ying-Hua, Wu, Kai-Chiang, Chao, Mango Chia-Tso |
| المصدر: | 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-7 Apr, 2023 |
| Relation: | 2023 IEEE 41st VLSI Test Symposium (VTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350346305 9798350346299 |
|---|---|
| تدمد: | 23751053 |
| DOI: | 10.1109/VTS56346.2023.10139998 |