مؤتمر
Test Generation for Defect-Based Faults of Scan Flip-Flops
العنوان: | Test Generation for Defect-Based Faults of Scan Flip-Flops |
---|---|
المؤلفون: | Nien, Yu-Teng, Li, Chen-Hong, Wu, Pei-Yin, Wang, Yung-Jheng, Wu, Kai-Chiang, Chao, Mango C.-T. |
المصدر: | 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-7 Apr, 2023 |
Relation: | 2023 IEEE 41st VLSI Test Symposium (VTS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350346305 9798350346299 |
---|---|
تدمد: | 23751053 |
DOI: | 10.1109/VTS56346.2023.10140039 |