مؤتمر
Test Generation for Defect-Based Faults of Scan Flip-Flops
| العنوان: | Test Generation for Defect-Based Faults of Scan Flip-Flops |
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| المؤلفون: | Nien, Yu-Teng, Li, Chen-Hong, Wu, Pei-Yin, Wang, Yung-Jheng, Wu, Kai-Chiang, Chao, Mango C.-T. |
| المصدر: | 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-7 Apr, 2023 |
| Relation: | 2023 IEEE 41st VLSI Test Symposium (VTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350346305 9798350346299 |
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| تدمد: | 23751053 |
| DOI: | 10.1109/VTS56346.2023.10140039 |