دورية أكاديمية
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
| العنوان: | Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits |
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| المؤلفون: | Zenari, M., Buffolo, M., Fornasier, M., De Santi, C., Goyvaerts, J., Grabowski, A., Gustavsson, J., Kumari, S., Stassren, A., Baets, R., Larsson, A., Roelkens, G., Meneghesso, G., Zanoni, E., Meneghini, M. |
| المصدر: | IEEE Journal of Quantum Electronics IEEE J. Quantum Electron. Quantum Electronics, IEEE Journal of. 59(4):1-10 Aug, 2023 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189197 15581713 |
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| DOI: | 10.1109/JQE.2023.3283514 |