دورية أكاديمية
Yield Methodology and Heater Process Variation in Phase Change Memory (PCM) Technology for Analog Computing
| العنوان: | Yield Methodology and Heater Process Variation in Phase Change Memory (PCM) Technology for Analog Computing |
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| المؤلفون: | Chan, V., Gasasira, A., Pujari, R., Tseng, W., Gordon, T., Southwick, R., Ok, I., Choi, S., Silvestre, C., Utomo, H., Brew, K., Philip, T., Burr, G.W., Saulnier, N., Teehan, S., Ahsan, I. |
| المصدر: | IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 36(3):327-331 Aug, 2023 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 08946507 15582345 |
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| DOI: | 10.1109/TSM.2023.3284313 |