التفاصيل البيبلوغرافية
| العنوان: |
The Impact of the Dead-Time on the Reverse Recovery Behavior of SiC-MOSFET Body Diodes |
| المؤلفون: |
Liu, Xing, Li, Xupeng, Herrmann, Clemens, Basler, Thomas |
| المصدر: |
2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2023 35th International Symposium on. :322-325 May, 2023 |
| Relation: |
2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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