Towards knowledge-enhanced process models for semiconductor fabrication

التفاصيل البيبلوغرافية
العنوان: Towards knowledge-enhanced process models for semiconductor fabrication
المؤلفون: Rothe, Tom, Sayyed, Mudassir Ali, Langer, Jan, Gottfried, Knut, Schuster, Jorg, Stoll, Martin, Kuhn, Harald
المصدر: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) Advanced Metallization Conference (MAM)(IITC/MAM), 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for. :1-3 May, 2023
Relation: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350310979
تدمد:23806338
DOI:10.1109/IITC/MAM57687.2023.10154872