مؤتمر
Failure Rate Identification of a Reparable System Governed by Coupled ODE-PDEs and Deep Learning based Implementation
| العنوان: | Failure Rate Identification of a Reparable System Governed by Coupled ODE-PDEs and Deep Learning based Implementation |
|---|---|
| المؤلفون: | Hu, Weiwei, Tepper, Alexander, Xie, Bin, Zhang, Qing |
| المصدر: | 2023 American Control Conference (ACC) American Control Conference (ACC), 2023. :961-966 May, 2023 |
| Relation: | 2023 American Control Conference (ACC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350328066 9798350328073 |
|---|---|
| تدمد: | 23785861 |
| DOI: | 10.23919/ACC55779.2023.10156339 |