مؤتمر
Failure Rate Identification of a Reparable System Governed by Coupled ODE-PDEs and Deep Learning based Implementation
العنوان: | Failure Rate Identification of a Reparable System Governed by Coupled ODE-PDEs and Deep Learning based Implementation |
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المؤلفون: | Hu, Weiwei, Tepper, Alexander, Xie, Bin, Zhang, Qing |
المصدر: | 2023 American Control Conference (ACC) American Control Conference (ACC), 2023. :961-966 May, 2023 |
Relation: | 2023 American Control Conference (ACC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350328066 9798350328073 |
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تدمد: | 23785861 |
DOI: | 10.23919/ACC55779.2023.10156339 |