مؤتمر
Determining Graphene and Substrate Quality from the Coupled Hall Mobility Measurements and Theoretical Modeling
العنوان: | Determining Graphene and Substrate Quality from the Coupled Hall Mobility Measurements and Theoretical Modeling |
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المؤلفون: | Japec, K., Matic, M., Lukose, R., Lisker, M., Lukosius, M., Poljak, M. |
المصدر: | 2023 46th MIPRO ICT and Electronics Convention (MIPRO) ICT and Electronics Convention (MIPRO), 2023 46th MIPRO. :179-183 May, 2023 |
Relation: | 2023 46th MIPRO ICT and Electronics Convention (MIPRO) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9789532331059 9789532331042 |
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تدمد: | 26238764 |
DOI: | 10.23919/MIPRO57284.2023.10159692 |