Determining Graphene and Substrate Quality from the Coupled Hall Mobility Measurements and Theoretical Modeling

التفاصيل البيبلوغرافية
العنوان: Determining Graphene and Substrate Quality from the Coupled Hall Mobility Measurements and Theoretical Modeling
المؤلفون: Japec, K., Matic, M., Lukose, R., Lisker, M., Lukosius, M., Poljak, M.
المصدر: 2023 46th MIPRO ICT and Electronics Convention (MIPRO) ICT and Electronics Convention (MIPRO), 2023 46th MIPRO. :179-183 May, 2023
Relation: 2023 46th MIPRO ICT and Electronics Convention (MIPRO)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9789532331059
9789532331042
تدمد:26238764
DOI:10.23919/MIPRO57284.2023.10159692