دورية أكاديمية
A Metastability Risk Prediction and Mitigation Technique for Clock-Domain Crossing With Single-Stage Synchronizer in Near-Threshold-Voltage Multivoltage/ Frequency-Domain Network-on-Chip
| العنوان: | A Metastability Risk Prediction and Mitigation Technique for Clock-Domain Crossing With Single-Stage Synchronizer in Near-Threshold-Voltage Multivoltage/ Frequency-Domain Network-on-Chip |
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| المؤلفون: | Lin, C., He, W., Sun, Y., Shao, L., Zhang, B., Yang, J., Seok, M. |
| المصدر: | IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 59(2):616-625 Feb, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189200 1558173X |
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| DOI: | 10.1109/JSSC.2023.3283961 |