A Reliable Packaging Design for 1200-V, 500-A SiC Half-bridge Modules with Junction Temperature over 200 °C

التفاصيل البيبلوغرافية
العنوان: A Reliable Packaging Design for 1200-V, 500-A SiC Half-bridge Modules with Junction Temperature over 200 °C
المؤلفون: Wang, Jianing, Zhou, Weinan, Yu, Shaolin, Huang, Yaodong
المصدر: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2023 IEEE 6th International. :2188-2193 May, 2023
Relation: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350346671
DOI:10.1109/CIEEC58067.2023.10166115