Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards

التفاصيل البيبلوغرافية
العنوان: Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards
المؤلفون: Cheng, Deruo, Shi, Yiqiong, Tee, Yee-Yang, Song, Jingsi, Wang, Xue, Wen, Bihan, Gwee, Bah-Hwee
المصدر: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS) Artificial Intelligence Circuits and Systems (AICAS), 2023 IEEE 5th International Conference on. :1-5 Jun, 2023
Relation: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350332674
تدمد:28349857
DOI:10.1109/AICAS57966.2023.10168608