دورية أكاديمية

Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses

التفاصيل البيبلوغرافية
العنوان: Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses
المؤلفون: Mei, W., Liu, Z., Pan, C., Li, O., Su, Y., Zhou, Q.
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-11 2023
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
تدمد:00189456
15579662
DOI:10.1109/TIM.2023.3291001