Long-term Static Analysis Rule Quality Monitoring Using True Negatives

التفاصيل البيبلوغرافية
العنوان: Long-term Static Analysis Rule Quality Monitoring Using True Negatives
المؤلفون: Luo, Linghui, Mukherjee, Rajdeep, Tripp, Omer, Schaf, Martin, Zhou, Qiang, Sanchez, Daniel
المصدر: 2023 IEEE/ACM 45th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP) ICSE-SEIP Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2023 IEEE/ACM 45th International Conference on. :315-326 May, 2023
Relation: 2023 IEEE/ACM 45th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350300376
تدمد:28327659
DOI:10.1109/ICSE-SEIP58684.2023.00034