التفاصيل البيبلوغرافية
| العنوان: |
Doppelgänger Test Generation for Revealing Bugs in Autonomous Driving Software |
| المؤلفون: |
Huai, Y., Chen, Y., Almanee, S., Ngo, T., Liao, X., Wan, Z., Chen, Q.A., Garcia, J. |
| المصدر: |
2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE) ICSE Software Engineering (ICSE), 2023 IEEE/ACM 45th International Conference on. :2591-2603 May, 2023 |
| Relation: |
2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
Full Text Finder