A Scalable Die-to-Die Interconnect with Replay and Repair Schemes for 2.5D/3D Integration

التفاصيل البيبلوغرافية
العنوان: A Scalable Die-to-Die Interconnect with Replay and Repair Schemes for 2.5D/3D Integration
المؤلفون: Liao, Jie, Jiao, Bo, Zhang, Jinshan, Liu, Shiwei, Jiang, Hao, Tao, Jun, Jiang, Wenning, Liu, Qi, Zhang, Lihua, Zhu, Haozhe, Chen, Chixiao
المصدر: 2023 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2023 IEEE International Symposium on. :1-5 May, 2023
Relation: 2023 IEEE International Symposium on Circuits and Systems (ISCAS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665451093
تدمد:21581525
DOI:10.1109/ISCAS46773.2023.10181990