مؤتمر
Physical Understanding on the Anti-fuse Instability to Construct a Selector-Type One-Time-Programming Memory in the High-k Metal-Gate CMOS Generation
| العنوان: | Physical Understanding on the Anti-fuse Instability to Construct a Selector-Type One-Time-Programming Memory in the High-k Metal-Gate CMOS Generation |
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| المؤلفون: | Chuang, C. C., Chang, C. W., Chen, H. W., Kao, T. C., Li, Y. J., Guo, J. C., Chung, Steve S. |
| المصدر: | 2023 Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2023. :115-116 Jun, 2023 |
| Relation: | 2023 Silicon Nanoelectronics Workshop (SNW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9784863488083 |
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| تدمد: | 21614644 |
| DOI: | 10.23919/SNW57900.2023.10183939 |