التفاصيل البيبلوغرافية
| العنوان: |
Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs |
| المؤلفون: |
Chen, W.-C., Chen, S.-H., Veloso, A., Serbulova, K., Hellings, G., Groeseneken, G. |
| المصدر: |
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023 |
| Relation: |
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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