دورية أكاديمية
Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs
| العنوان: | Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs |
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| المؤلفون: | Lim, J.W., Yoo, C., Park, K., Jeon, J. |
| المصدر: | IEEE Access Access, IEEE. 11:82208-82215 2023 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 21693536 |
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| DOI: | 10.1109/ACCESS.2023.3297493 |