دورية أكاديمية
Impact of floating gate dry etching on erase characteristics in NOR flash memory
| العنوان: | Impact of floating gate dry etching on erase characteristics in NOR flash memory |
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| المؤلفون: | Lee, W.H., Dong-Kyu Lee, Young-Ho Na, Keon-Soo Kim, Kun-Ok Ahn, Kang-Deog Suh, Yonghan Roh |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 23(8):476-478 Aug, 2002 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2002.801305 |