An Adaptive Event-Driven Condition Generation Circuit for Linear CMOS Image Sensors

التفاصيل البيبلوغرافية
العنوان: An Adaptive Event-Driven Condition Generation Circuit for Linear CMOS Image Sensors
المؤلفون: Zhang, Hejiu, He, Haoran, Yu, Ningmei, Lv, Nan, Guo, Zhongjie
المصدر: 2023 6th International Conference on Electronics Technology (ICET) Electronics Technology (ICET), 2023 6th International Conference on. :103-107 May, 2023
Relation: 2023 6th International Conference on Electronics Technology (ICET)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350337693
9798350337686
تدمد:27686515
DOI:10.1109/ICET58434.2023.10211351