مؤتمر
Finite Element Simulation of Electromigration near Crack Tip under Electric Load
| العنوان: | Finite Element Simulation of Electromigration near Crack Tip under Electric Load |
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| المؤلفون: | Liu, Thomas Jin-Chee |
| المصدر: | 2023 13th International Conference on Power, Energy and Electrical Engineering (CPEEE) Power, Energy and Electrical Engineering (CPEEE), 2023 13th International Conference on. :8-12 Feb, 2023 |
| Relation: | 2023 13th International Conference on Power, Energy and Electrical Engineering (CPEEE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781665490146 9781665490139 |
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| DOI: | 10.1109/CPEEE56777.2023.10217564 |